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1 article(s) from Heinke, Lars

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

Thomas König,
Georg H. Simon,
Lars Heinke,
Leonid Lichtenstein and
Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

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Figure 1: Model of a binary oxide surface. Point defects such as color centers, which are preferably situated...

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Figure 2: Experimental setup. a) Schematic of an Eigler-style bath cryostat. b) The walker unit is situated o...

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Figure 3: The same tip senses both signals. (a–d) Pairs of simultaneously recorded signal curves from the fre...

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Figure 4: Energetic levels. a) The Fermi levels of tip and sample when they are not electrically connected. b...

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Figure 5: Magnesium oxide surface. a) Atomically resolved image recorded by NC-AFM. The position I and II ind...

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Figure 6: Spectroscopy on point defects. a) NC-AFM image of 21 nm × 9 nm measured at a frequency shift of Δf ...

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Figure 7: Dependence on tip-sample distance. Constant height line-scans across an F⁰ defect situated at a ste...

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Figure 8: Dependence on tip-sample distance. a) Shift of the resonance frequency of a Pt_0.9Ir_0.1 tip on a reg...

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Figure 9: Color centers on MgO. The left labeling assigns numbers to the defect types. The left graph shows t...

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Figure 10: Atomic resolution NC-AFM image of a straight antiphase domain boundary (type I) in the aluminum oxi...

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Figure 11: Height proﬁles. a) Cutout from Figure 10. White lines indicate positions where line proﬁles have been taken ...

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Figure 12: Spectroscopy on aluminum oxide. a) STM image of a thin ﬁlm of aluminum oxide on NiAl(110), 18 nm × ...

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Review

Published 03 Jan 2011

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